SEMICON Japan 2026Products & Services Testing, Characterization, and Reliability Assessment from Wafer to System Level
Testing, Characterization, and Reliability Assessment from Wafer to System Level
Exhibitor
Fraunhofer Institute for Electronic Nano Systems ENAS
Our Range of Services to Support Your Success
Development of test solutions at the wafer, chip, and component level for MEMS, Beyond CMOS, quantum, electronic, and photonic components
Material characterization
Thermo-mechanical and electrical reliability assessment, as well as Prognostic Health Management (PHM), including the prediction of the system state
Method development, including validation
Service for functional prototypes, demonstrators, and small batches